低軌道宇宙ミッション向けSiPMの放射線耐性評価

This work presents a comprehensive radiation hardness characterization of SiPM devices for space-based applications: FBK NUV-HD-MT and NUV-HD-LowCT (1$\times$1, 3$\times$3, and 6$\times$6~mm$^2$) and Hamamatsu S14160 MPPCs with equivalent active areas. Total Ionizing Dose (TID) tests were performed at the ESA/ESTEC Co-60 facility with a level of dose up to 20~krad in silicon, while displacement damage effects were evaluated using 100~MeV protons with a fluence up to $1.12\times10^{11}$~p/cm$^2$ at the Paul Scherrer Institute. Radiation damage in SiPMs manifests through two main mechanisms: ionizing energy loss and non-ionizing energy loss (NIEL), which increases dark current and dark count rate. In this work, breakdown voltage, dark current, and quenching resistance were systematically measured as functions of accumulated dose and fluence. Gain and dark count rates were indirectly measured from the characterized electrical parameters. Both technologies exhibit remarkable stability of most of the functional parameters across all dose levels, while dark current shows predictable increases significantly more pronounced under proton irradiation due to displacement damage. Based on these results, both FBK and Hamamatsu devices are confirmed suitable for Low Earth Orbit (LEO) mission environment.