同じ解像度で比べた多ビーム・プチコグラフィの測定利得

Single-beam ptychography (SBP) requires overlapping scan positions for reliable reconstruction, and imaging larger areas demands more measurements. Multi-beam ptychography (MBP) illuminates several regions simultaneously, but its measurement gain at a fixed resolution remains unclear when diffraction intensities from different beams overlap on the detector. Using numerical simulations, we determined the minimum number of patterns needed to reach a target resolution by varying the scan step size for SBP and fully overlapped MBP with up to 15 beams. We define gain as the pattern count for repeated SBP scans divided by that for MBP at the same total imaged area and achieved resolution. Although the required MBP pattern count increased approximately linearly with beam number, it remained below that of repeated SBP scans. At 67% of the spatial Nyquist frequency using a one-bit threshold, fully overlapped MBP achieved a gain of approximately two. Detector cropping and lower-resolution targets reduced this gain, showing its dependence on usable diffraction information and the reconstruction criterion. Because overlapping intensities provide no spatial identification of individual beam contributions, this gain is a conservative benchmark; separation on the detector offers a route to larger gains.